Work

Atomic mass spectrometry

Year: 1999

Type: article

Source: Journal of Analytical Atomic Spectrometry

DOI: 10.1039/a905419g

Authors: Jeffrey R. Bacon, Jeffrey S. Crain, Luc Van Vaeck, John G. Williams

Language: English

Topic: Mass Spectrometry Techniques and Applications

Subfield: Spectroscopy

Field: Chemistry

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2136718600

FWCI: 1.741

Cites: 223

Cited by: 20

Related to: 10