Exponential ionic drift: fast switching and low volatility of thin-film memristors
Year: 2008
Type: article
Source: Applied Physics A
Authors: Dmitri B. Strukov, R. Stanley Williams
Institution: Hewlett-Packard (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2136811604