High-Resolution Transmission Electron Microscopy Using Negative Spherical Aberration
Year: 2004
Type: article
Source: Microscopy and Microanalysis
Authors: Chun-Lin Jia, Markus Lentzen,, Knut Urban
Institution: Forschungszentrum Jülich
Language: English
Subfield: Structural Biology
Domain: Life Sciences
Open Access status: closed
OpenAlex ID: W2137167699