Work

The Extent, Causes and Importance of Context Effects on Item Parameters for Two Latent Trait Models

Year: 1980

Type: article

Source: Journal of Educational Measurement

DOI: 10.1111/j.1745-3984.1980.tb00833.x

Author: WENDY M. YEN

Institution: McGraw-Hill Education (United States)

Language: English

Topic: Psychometric Methodologies and Testing

Subfield: Management Science and Operations Research

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2137478484

FWCI: 3.087

Cites: 24

Cited by: 76

Related to: 10