Work

SIM comparison of dc resistance at 1 Ω, 1 MΩ, and 1 GΩ

Year: 2008

Type: conference-paper

Source: Conference on Precision Electromagnetic Measurements

DOI: 10.1109/cpem.2008.4574695

Authors: D. G. Jarrett, R. E. Elmquist, N. F. Zhang, A. Tonina, M. Porfiri, J. Fernandes, H. Schechter, D. Izquierdo, C. Faverio, D. Slomovitz, D. Inglis, K. Wendler, F. Hernandez, B. Rodriguez

Institutions: National Institute of Standards and Technology, National Institute of Industrial Technology, Instituto Nacional de Metrologia, Qualidade e Tecnologia, National Administration of Power Plants and Electrical Transmissions (Uruguay), National Research Council Canada, National Metrology Center

Language: English

Topic: Scientific Measurement and Uncertainty Evaluation

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

Funder: National Institute of Standards and Technology

OpenAlex ID: W2138334995

FWCI: 0.97

Cites: 4

Cited by: 1

Related to: 10