Work

Complementary Formal Approaches for Dependability Analysis

Year: 2009

Type: conference-paper

Source: Proceedings

DOI: 10.1109/dft.2009.21

Authors: Souheib Baarir, Cécile Braunstein, Renaud Clavel, Emmanuelle Encrenaz, Jean-Michel Ilié, Régis Leveugle, Isabelle Mounier, Laurence Pierre, Denis Poitrenaud

Institutions: LIP6, Techniques of Informatics and Microelectronics for Integrated Systems Architecture

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139404439

FWCI: 1.874

Cites: 17

Cited by: 15

Related to: 10