Work

The Avaatech XRF Core Scanner: technical description and applications to NE Atlantic sediments

Year: 2006

Type: article

Source: Geological Society London Special Publications

DOI: 10.1144/gsl.sp.2006.267.01.03

Authors: Thomas O. Richter, Sjerry van der Gaast, Bob Koster, Aad Vaars, Rineke Gieles, Henko C. de Stigter, Henk De Haas, Tjeerd C. E. van Weering

Institution: Royal Netherlands Institute for Sea Research

Language: English

Topic: Geochemistry and Elemental Analysis

Subfield: Geochemistry and Petrology

Field: Earth and Planetary Sciences

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139782170

FWCI: 12.17

Cites: 29

Cited by: 539

Related to: 9