Plasma-Assisted CD Shrink and Overlay Metrology Techniques for Double Patterning ISSM Paper: PE-O-167
Year: 2007
Type: article
Authors: Reza Sadjadi, Helen Zhu, Peter Cirigliano, Elizabeth G. Pavel, Amulya Athayde, Cornel Bozdog, Michael Sendler, Danny Mor
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2140942945
