Work

Current single event effects results for candidate spacecraft electronics for NASA

Year: 2005

Type: conference-paper

Abstract: We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others.

Source: IEEE Radiation Effects Data Workshop (REDW)

DOI: 10.1109/redw.2004.1352897

Authors: M.V. O'Bryan, C.M. Seidleck, M.A. Carts, J.W. Howard, H.S. Kim, J.D. Forney, K.A. Label, C.J. Marshall, R.A. Reed, A.B. Sanders, D.K. Hawkins, S.R. Cox, S.P. Buchner, T.R. Oldham, J. Sutton, T.L. Irwin, E. Rodriguez, D. McMorrow, S.D. Kniffin, R.L. Ladbury, M. Walter, C. Palor, P.W. Marshall, M. McCall, S. Meyer, J. Lintz, J. Rodgers, S. Mohammed, D. Rapchun

Institutions: Goddard Space Flight Center, Jackson and Tull (United States), Orbital Sciences (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

Funders: National Aeronautics and Space Administration, Michigan State University, Defense Threat Reduction Agency, College of Engineering, Michigan State University

OpenAlex ID: W2141374144

FWCI: 7.148

Cites: 21

Cited by: 28

Related to: 10