Examination of PbI/sub 2/ and HgI/sub 2/ photoconductive materials for direct detection, active matrix, flat-panel imagers for diagnostic X-ray imaging
Year: 2005
Type: article
Institution: University of Michigan
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2141577580
