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Graphene Metrology: Centimeter‐Scale High‐Resolution Metrology of Entire CVD‐Grown Graphene Sheets (Small 18/2011)

Year: 2011

Type: article

Source: Small

DOI: 10.1002/smll.201190068

Authors: Jennifer Reiber Kyle, Ali Guvenc, Wei Wang, Maziar Ghazinejad, Jian Lin, Shirui Guo, Cengiz S. Ozkan, Mihrimah Ozkan

Institution: University of California, Riverside

Language: English

Topic: Graphene research and applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2142402052

FWCI:

Cites:

Cited by: 4

Related to: 10