Application of pan‐sharpening to SIMS imaging
Year: 2014
Type: article
Source: Surface and Interface Analysis
DOI: 10.1002/sia.5540
Authors: Jay Tarolli, Hua Tian, Nicholas Winograd
Institution: Pennsylvania State University
Language: English
Subfield: Computational Mechanics
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: U.S. Department of Energy
Award: G5288933092
OpenAlex ID: W2144768680
