Work

A computation method for evaluating importance-measures of gates in a fault tree

Year: 1997

Type: article

Source: IEEE Transactions on Reliability

DOI: 10.1109/24.664007

Authors: Hae Sang Lee, Chang Hoon Lie, Jung Sik Hong

Institutions: Samsung (South Korea), Samsung SDS (South Korea), Seoul National University

Language: English

Topic: Risk and Safety Analysis

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2145293901

FWCI: 0.597

Cites: 4

Cited by: 13

Related to: 10