Work

Current single event effects and radiation damage results for candidate spacecraft electronics

Year: 2003

Type: conference-paper

Abstract: We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced damage, and total ionizing dose. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, analog-to-digital converters (ADCs), digital-to-analog converters (DACs), and DC-DC converters, among others.

Source: IEEE Radiation Effects Data Workshop (REDW)

DOI: 10.1109/redw.2002.1045537

Authors: M.V. O'Bryan, K.A. LaBel, R.L. Ladbury, C. Poivey, J.W. Howard, R.A. Reed, S.D. Kniffin, S.P. Buchner, J.P. Bings, J.L. Titus, S.D. Clark, T.L. Turflinger, C.M. Seidleck, C.J. Marshall, P.W. Marshall, H.S. Kim, D.K. Hawkins, M.A. Carts, J.D. Forney, M.R. Jones, A.B. Sanders, T.L. Irwin, S.R. Cox, Z.A. Kahric, C.D. Palor, J.A. Sciarini

Institutions: Raytheon (United States), Goddard Space Flight Center, Orbital Sciences (United States), Stinger Ghaffarian Technologies (United States), Jackson and Tull (United States), Naval Sea Systems Command, NSWC Crane Division

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2146032887

FWCI: 8.642

Cites: 19

Cited by: 57

Related to: 10