Work

Tissue Damage by Pulsed Electrical Stimulation

Year: 2007

Type: article

Source: IEEE Transactions on Biomedical Engineering

DOI: 10.1109/tbme.2007.908310

Authors: A. Butterwick, A. Vankov, P. Huie, Y. Freyvert, D. Palanker

Institutions: Stanford University, Stanford Medicine, Sangamo BioSciences (United States)

Language: English

Topic: Neuroscience and Neural Engineering

Subfield: Cellular and Molecular Neuroscience

Field: Neuroscience

Domain: Life Sciences

SDG: Good health and well-being

Open Access status: closed

Funder: National Eye Institute

Award: Pulsed Electron Avalanche Knife: Intraocular Microsurg.

OpenAlex ID: W2146199250

FWCI: 1.369

Cites: 34

Cited by: 136

Related to: 10