Work

Development of Winged Microscanners: Architecture and Performance

Year: 2004

Type: article

Source: IEEE Sensors Journal

DOI: 10.1109/jsen.2004.833496

Authors: D. Yan, B. Xu, J. Castracane

Institutions: State University of New York, Cornell University, University at Albany, State University of New York

Language: English

Topic: Advanced MEMS and NEMS Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2146240961

FWCI: 1.302

Cites: 13

Cited by: 4

Related to: 10