Work

High-resolution strain mapping in bulk samples using full-profile analysis of energy-dispersive synchrotron X-ray diffraction data

Year: 2004

Type: article

Abstract: The feasibility of both high spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beamline ID15A at the ESRF. The data analysis was performed using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point uncertainty of 10−5. The measurements have been validated with complementary techniques or reference data.

Source: Journal of Applied Crystallography

DOI: 10.1107/s0021889804023349

Authors: A. Steuwer, J. R. Santisteban, M. Turski, P. J. Withers, T. Buslaps

Institutions: University of Manchester, The Open University, European Synchrotron Radiation Facility

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $5,110

OpenAlex ID: W2146714266