Dynamic X-parameters*: Behavioral modeling in the presence of long term memory effects
Year: 2012
Type: article
Authors: Jan Verspecht, David E. Root, Troels S. Nielsen
Institution: Agilent Technologies (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2147106307