Work

Imaging Electromigration during the Formation of Break Junctions

Year: 2007

Type: article

Source: Nano Letters

DOI: 10.1021/nl062631i

Authors: Thiti Taychatanapat, Kirill I. Bolotin, Ferdinand Kuemmeth, Daniel C. Ralph

Institution: Cornell University

Language: English

Topic: Molecular Junctions and Nanostructures

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Army Research Office

OpenAlex ID: W2147346292

FWCI: 11.65

Cites: 25

Cited by: 128

Related to: 10