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Pairwise Test Case Generation for Less Number of Test- Case Sets

Year: 2012

Type: article

Authors: S. Gupta, Avdhesh Gupta

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2147393801

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Cites: 26

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Related to: 10