Work

Orientation dependence of interface-trap transformation

Year: 1989

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/23.45370

Authors: Y. Wang, T.P. Ma, R.C. Barker

Institution: Yale University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2147683783

FWCI: 2.83

Cites: 13

Cited by: 20

Related to: 10