Work

A novel buried lightly doped drain CMOS design for optimizing hot carrier versus device performance

Year: 2005

Type: conference-paper

Source: IEEE Workshop on Microelectronics and Electron Devices (WMED)

DOI: 10.1109/wmed.2005.1431613

Authors: M. Thomason, M. Nelson, B. Greenwood, J. Prasad, S. Steidley

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2148927562

FWCI:

Cites: 7

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Related to: 10