Work

Probabilistic and Monte Carlo risk models for carbon nanomaterial production processes

Year: 2008

Type: conference-paper

Source: IEEE International Symposium on Electronics and the Environment (ISEE)

DOI: 10.1109/isee.2008.4562944

Authors: Zeynep D. Ok, Jacqueline A. Isaacs, James C. Benneyan

Institution: Northeastern University

Language: English

Topic: Risk and Safety Analysis

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2149082142

FWCI: 1.94

Cites: 12

Cited by: 3

Related to: 10