Work

New methods for determining the void content of silicon single crystals

Year: 1999

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/19.769570

Authors: F. Spaepen, A. Eliat

Institution: Harvard University

Language: English

Topic: Scientific Measurement and Uncertainty Evaluation

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2149262863

FWCI: 1.835

Cites: 15

Cited by: 10

Related to: 10