Work

Vulnerability Analysis of L2 Cache Elements to Single Event Upsets

Year: 2006

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.1109/date.2006.244100

Authors: H. Asadi, V. Sridharan, M.B. Tahoori, D. Kaeli

Institution: Northeastern University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2151612544

FWCI: 6.202

Cites: 25

Cited by: 55

Related to: 10