Work

Progress in the measurement of lattice spacing d(220) of silicon

Year: 1997

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/19.571922

Authors: K. Nakayama, H. Fujimoto

Language: English

Topic: Scientific Measurement and Uncertainty Evaluation

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2152531397

FWCI: 5.365

Cites: 19

Cited by: 49

Related to: 10