Soft Errors in Advanced Computer Systems
Year: 2005
Type: article
Source: IEEE Design & Test of Computers
DOI: 10.1109/mdt.2005.69
Author: R. Baumann
Institution: Texas Instruments (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2152652532