Work

Influence of interfacial depth on depth resolution during GDOES depth profiling analysis of thin alumina films

Year: 2001

Type: article

Source: Surface and Interface Analysis

DOI: 10.1002/sia.1120

Authors: K. Shimizu, H. Habazaki, P. Skeldon, G. E. Thompson, R. K. Marcus

Institutions: Keio University, Hokkaido University, University of Manchester, Clemson University

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2153088798

FWCI: 2.782

Cites: 11

Cited by: 33

Related to: 10