A culture model of development reveals multiple properties of RPE tight junctions.
Year: 1997
Type: article
Source: PubMed
Authors: Y Ban, L J Rizzolo
Institution: Yale University
Language: English
Subfield: Neurology
Field: Neuroscience
Domain: Life Sciences
Open Access status: closed
Funder: National Eye Institute
OpenAlex ID: W2153474702
