Work

Measurement of noise characteristics of MEMS accelerometers

Year: 2002

Type: article

Source: Solid-State Electronics

DOI: 10.1016/s0038-1101(02)00220-4

Authors: Faisal Mohd-Yasin, Can E Korman, David J Nagel

Institution: George Washington University

Language: English

Topic: Advanced MEMS and NEMS Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2155350166

FWCI: 1.72

Cites: 3

Cited by: 46

Related to: 10