Work

Measurement of Sheet Resistivities with the Four-Point Probe

Year: 1958

Type: article

Source: Bell System Technical Journal

DOI: 10.1002/j.1538-7305.1958.tb03883.x

Author: F. M. Smits

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2155727422

FWCI: 5.353

Cites: 3

Cited by: 1,750

Related to: 10