Work

High-resolution imaging with an aberration-corrected transmission electron microscope

Year: 2002

Type: article

Source: Ultramicroscopy

DOI: 10.1016/s0304-3991(02)00139-0

Authors: M. Lentzen, B. Jahnen, C.L. Jia, A. Thust, K. Tillmann, K. Urban

Institution: Forschungszentrum Jülich

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

Funder: Deutsche Forschungsgemeinschaft

OpenAlex ID: W2155793986

FWCI: 5.389

Cites: 13

Cited by: 218

Related to: 9