Work

Characterization of two standard CMOS EEPROM designs

Year: 2002

Type: conference-paper

Source: IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)

DOI: 10.1109/mwscas.2001.986331

Authors: D. Walker, B. Skotko, J. Snyder, N. Riyanto, T. James, S. Bibyk

Institution: The Ohio State University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2156944975

FWCI: 0.356

Cites: 6

Cited by: 2

Related to: 10