Work

Reducing focused ion beam damage to transmission electron microscopy samples

Year: 2004

Type: article

Source: Journal of Electron Microscopy

DOI: 10.1093/jmicro/dfh080

Author: N. I. Kato

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: General Materials Science

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2157057971

FWCI: 11.08

Cites:

Cited by: 233

Related to: 10