Work

Quantitative trait loci mapping of pubescence density and flowering time of insect-resistant soybean (Glycine max L. Merr.)

Year: 2007

Type: article

Abstract: Analysis of antibiosis resistance to common cutworm (Spodoptera litura Fabricius) in soybean (Glycine max (L.) Merr.) has progressed significantly, but the immediate cause remains unknown. We performed quantitative trait loci (QTL) analysis of pubescence density and plant development stage because these factors are assumed to be the immediate cause of resistance to cutworm. The QTLs for pubescence appeared to be identical to the previously detected the Pd1 and Ps loci controlling pubescence density. We found no candidate loci for flowering time QTLs, although one could be identical to the gene governing the long-juvenile trait or to the E6 loci controlling maturity. None of the QTLs overlapped with the QTLs for antibiosis resistance.

Source: Genetics and Molecular Biology

DOI: 10.1590/s1415-47572007000400022

Authors: Kunihiko Komatsu, Shiori Okuda, Masakazu Takahashi, Ryoichi Matsunaga, Yoshinori Nakazawa

Institutions: National Agriculture and Food Research Organization, Japan International Research Center for Agricultural Sciences

Language: English

Topic: Soybean genetics and cultivation

Subfield: Plant Science

Field: Agricultural and Biological Sciences

Domain: Life Sciences

SDG: Zero hunger

Open Access status: gold

Estimated APC paid: $700