Work

Kinematical study of GexSi1 – x/Si strained-layer superlattice by a double crystal X-ray diffraction method

Year: 1993

Type: article

Source: Philosophical Magazine Letters

DOI: 10.1080/09500839308240484

Authors: X. F. Duan, Y. T. Wang, Sheng, J. T. Ouyang

Institutions: Chinese Academy of Sciences, Institute of Semiconductors, Fudan University, Institute of Physics

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W2160744845

FWCI: 0.356

Cites: 11

Cited by: 1

Related to: 10