Work

Error analysis and tolerance allocation for confocal scanning microscopy using the Monte Carlo method

Year: 2004

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.529942

Authors: Hongki Yoo, Dong-Kyun Kang, SeungWoo Lee, Junhee Lee, Dae-Gab Gweon

Institution: Korea Advanced Institute of Science and Technology

Language: English

Topic: Manufacturing Process and Optimization

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2161307848

FWCI:

Cites: 11

Cited by: 1

Related to: 10