Work

Polarization- and Phase-Sensitive Low-Coherence Interferometry Setup for the Characterization of Integrated Optical Components

Year: 2009

Type: article

Source: Journal of Lightwave Technology

DOI: 10.1109/jlt.2009.2022506

Authors: C. Canavesi, F. Morichetti, A. Canciamilla, F. Persia, A. Melloni

Institutions: University of Rochester, Politecnico di Milano

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2161868974

FWCI: 3.309

Cites: 29

Cited by: 22

Related to: 10