Work

A MEMS-based projection display

Year: 1998

Type: article

Source: Proceedings of the IEEE

DOI: 10.1109/5.704274

Authors: P.F. Van Kessel, L.J. Hornbeck, R.E. Meier, M.R. Douglass

Institution: Texas Instruments (United States)

Language: English

Topic: Advanced Optical Imaging Technologies

Subfield: Media Technology

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2162869577

FWCI: 60.45

Cites: 12

Cited by: 611

Related to: 10