Pulsed r.f.‐glow‐discharge time‐of‐flight mass spectrometry for fast surface and interface analysis of conductive and non‐conductive materials
Year: 2006
Type: article
Source: Surface and Interface Analysis
DOI: 10.1002/sia.2253
Institutions: Empa, Tofwerk (Switzerland)
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2163597701