Work

Nanometer-scale elastic modulus of surfaces and thin films determined using an atomic force microscope

Year: 2009

Type: conference-paper

Source: IEEE Nanotechnology Materials and Devices Conference (NMDC)

DOI: 10.1109/nmdc.2009.5167570

Authors: Alex G. Li, Larry W. Burggraf, David M. Phillips

Institutions: U.S. Air Force Institute of Technology, United States Air Force Research Laboratory, U.S. Air Force Research Laboratory Materials and Manufacturing Directorate

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: U.S. Air Force, Air Force Materiel Command

OpenAlex ID: W2163882636

FWCI: 1.542

Cites: 14

Cited by: 1

Related to: 10