Work

Zener and avalanche breakdown in As-implanted low-voltage Si n-p junctions

Year: 1976

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/t-ed.1976.18438

Authors: R.B. Fair, H.W. Wivell

Institution: AT&T (United States)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2164189299

FWCI: 0.719

Cites: 26

Cited by: 90

Related to: 10