Work

Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy

Year: 2008

Type: article

Source: Carbon

DOI: 10.1016/j.carbon.2008.06.022

Authors: P. Nemes-Incze, Z. Osváth, K. Kamarás, L.P. Biró

Institutions: Institute for Technical Physics and Materials Science, Hungarian Academy of Sciences, Institute for Solid State Physics and Optics

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

Funders: Hungarian Scientific Research Fund, Nemzeti Kutatási és Technológiai Hivatal

Awards: G1095863411, G2914897317

OpenAlex ID: W2164856334

FWCI: 12.06

Cites: 30

Cited by: 604

Related to: 10