Work

Feature extraction algorithm based on adaptive wavelet packet for surface defect classification

Year: 2002

Type: conference-paper

Source: Proceedings - International Conference on Image Processing

DOI: 10.1109/icip.1996.560968

Authors: C.S. Lee, C.-H. Choi, J.Y. Choi, Y.K. Kim, S.H. Choi

Institution: Seoul National University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2165321742

FWCI: 4.32

Cites: 8

Cited by: 29

Related to: 10