Work

A novel approach to efficient yield estimation for microwave integrated circuits

Year: 2003

Type: conference-paper

Source: IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)

DOI: 10.1109/mwscas.1999.867282

Authors: J.F. Swidzinski, M. Keramat, K. Chang

Institution: Texas A&M University

Language: English

Topic: Probabilistic and Robust Engineering Design

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2165680786

FWCI: 0.894

Cites: 8

Cited by: 11

Related to: 10