ConSeq: detecting concurrency bugs through sequential errors
Year: 2011
Type: conference-paper
Authors: Wei Zhang, Junghee Lim, Ramya Olichandran, Joel Scherpelz, Guoliang Jin, Shan Lu, Thomas Reps
Institution: University of Wisconsin–Madison
Language: English
Subfield: Software
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2166841005