Work

In situ measurements of stress evolution in silicon thin films during electrochemical lithiation and delithiation

Year: 2010

Type: article

Source: Journal of Power Sources

DOI: 10.1016/j.jpowsour.2010.02.013

Authors: Vijay A. Sethuraman, Michael J. Chon, Maxwell Shimshak, Venkat Srinivasan, Pradeep R. Guduru

Institutions: Lawrence Berkeley National Laboratory, Brown University

Language: English

Topic: Advancements in Battery Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

Funders: National Science Foundation, U.S. Department of Energy, Brown University, Materials Research Science and Engineering Center, Harvard University, Division of Materials Research, Lawrence Berkeley National Laboratory

Awards: G1079818582, G1143651532, G1286236842, G42916606, G7354628648

OpenAlex ID: W2166946044

FWCI: 26.46

Cites: 29

Cited by: 643

Related to: 9