Work

An approach to lifetime estimation of SiC MOSFETs subjected to thermal stress

Year: 2015

Type: dissertation

Source: TU/e Research Portal

Authors: Roel ten Have, Bas Vermulst, Jeroen van Duivenbode

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: closed

OpenAlex ID: W2167188928

Cites:

Cited by: 10

Related to: 10