Soft X-Ray Photoemission Measurement of Schottky Barrier Formation at The Pd-si Interface
Year: 1982
Type: article
Source: MRS Proceedings
DOI: 10.1557/proc-18-337
Authors: R. Purtell, P. S. Ho, G. W. Rubloff, G. Holinger
Institution: IBM Research - Thomas J. Watson Research Center
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2167440492