Work

Embedded erase failure in NOR flash EEPROM memory

Year: 2008

Type: conference-paper

Source: International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

DOI: 10.1109/icsict.2008.4734664

Authors: Bryan Lim, Vivien Wong, L. C. Gooi, Cecilia Lee, Caroline Francis, K. Y. Lee

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2167569007

FWCI:

Cites: 4

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Related to: 10